Invention Grant
US08415623B2 Processing detector array signals using stacked readout integrated circuits 有权
使用堆叠读出集成电路处理检测器阵列信号

  • Patent Title: Processing detector array signals using stacked readout integrated circuits
  • Patent Title (中): 使用堆叠读出集成电路处理检测器阵列信号
  • Application No.: US12952282
    Application Date: 2010-11-23
  • Publication No.: US08415623B2
    Publication Date: 2013-04-09
  • Inventor: Roger W. Graham
  • Applicant: Roger W. Graham
  • Applicant Address: US MA Waltham
  • Assignee: Raytheon Company
  • Current Assignee: Raytheon Company
  • Current Assignee Address: US MA Waltham
  • Agency: Lando & Anastasi, LLP
  • Main IPC: G01J5/00
  • IPC: G01J5/00
Processing detector array signals using stacked readout integrated circuits
Abstract:
According to certain embodiments, an apparatus comprises a first readout integrated circuit (ROIC), a second ROIC, and a dual band detector array. The first ROIC comprises first unit cells. The second ROIC is disposed outwardly from the first ROIC and comprises a second unit cells. Electrically conductive vias are disposed through the second ROIC and at least into the first ROIC. The detector array is disposed outwardly from the second ROIC. The detector array is configured to detect high dynamic range infrared light and comprises detector pixels. Each detector pixel is configured to generate a current in response to detecting light and send the current to a via. A via is configured to send the signal to a second unit cell and a first unit cell.
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