Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US13037927Application Date: 2011-03-01
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Publication No.: US08415668B2Publication Date: 2013-04-09
- Inventor: Shunpei Yamazaki
- Applicant: Shunpei Yamazaki
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2000-135602 20000509
- Main IPC: H01L29/04
- IPC: H01L29/04
Abstract:
A means of forming unevenness for preventing specular reflection of a pixel electrode, without increasing the number of process steps, is provided. In a method of manufacturing a reflecting type liquid crystal display device, the formation of unevenness (having a radius of curvature r in a convex portion) in the surface of a pixel electrode is performed by the same photomask as that used for forming a channel etch type TFT, in which the convex portion is formed in order to provide unevenness to the surface of the pixel electrode and give light scattering characteristics.
Public/Granted literature
- US08525173B2 Semiconductor device and manufacturing method thereof Public/Granted day:2013-09-03
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