Invention Grant
- Patent Title: Down-converting and detecting photons
- Patent Title (中): 下转换和检测光子
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Application No.: US12952330Application Date: 2010-11-23
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Publication No.: US08415759B2Publication Date: 2013-04-09
- Inventor: Frank B. Jaworski , Moungi Bawendi , Scott M. Geyer
- Applicant: Frank B. Jaworski , Moungi Bawendi , Scott M. Geyer
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Lando & Anastasi, LLP
- Main IPC: H01L31/0232
- IPC: H01L31/0232

Abstract:
In certain embodiments, an apparatus for down-converting and detecting photons includes a detector layer and a nanocrystal layer. The nanocrystal layer includes nanocrystals operable to absorb first photons of a higher energy and emit second photons of a lower energy in response to the absorption. The detector layer is configured to detect the second photons. In certain embodiments, a method for manufacturing an apparatus for down-converting and detecting photons includes preparing an outer surface of a substrate. Nanocrystals are disposed outwardly from the outer surface. The nanocrystals are operable to absorb first photons of a higher energy and emit second photons of a lower energy in response to the absorption.
Public/Granted literature
- US20120126354A1 Down-Converting And Detecting Photons Public/Granted day:2012-05-24
Information query
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