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US08415812B2 Materials and methods for stress reduction in semiconductor wafer passivation layers 有权
半导体晶片钝化层应力减少的材料和方法

Materials and methods for stress reduction in semiconductor wafer passivation layers
Abstract:
The present invention provides polyimide polymer materials for passivating semiconductor wafers and methods for fabricating thereof. The present invention further provides a device that includes a semiconductor wafer and a passivating layer disposed on the surface of the wafer, wherein the passivating layer comprises such polyimide polymers.
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