Invention Grant
- Patent Title: Lightwave interference measurement apparatus used to measure optical path length or distance
- Patent Title (中): 用于测量光路长度或距离的光波干涉测量装置
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Application No.: US13038683Application Date: 2011-03-02
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Publication No.: US08416422B2Publication Date: 2013-04-09
- Inventor: Takamasa Sasaki , Yoshiyuki Kuramoto
- Applicant: Takamasa Sasaki , Yoshiyuki Kuramoto
- Applicant Address: JP
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2010-046321 20100303; JP2010-183615 20100819
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
A lightwave interference measurement apparatus includes a phase detector configured to detect a phase of a signal of an interference between light from a distance-measurement light source and reflected on a reference surface and light from the distance-measurement light source and reflected on a target surface, an intensity detector configured to detect an intensity of light from a non-distance-measurement light source having a wavelength different from that of the distance-measurement light source and reflected on the reference surface and an intensity of light from the non-distance-measurement light source and reflected on the target surface, and an analyzer configured to calculate a geometric distance based on an optical path length calculated from the phase and a wavelength of the distance-measurement light source, and an average value of a vapor pressure distribution between the target surface and the reference surface calculated from intensity information of the light from the non-distance-measurement light source.
Public/Granted literature
- US20110216326A1 LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS USED TO MEASURE OPTICAL PATH LENGTH OR DISTANCE Public/Granted day:2011-09-08
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