Invention Grant
- Patent Title: Local sensing in a memory device
- Patent Title (中): 存储设备中的本地感测
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Application No.: US13609424Application Date: 2012-09-11
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Publication No.: US08416628B2Publication Date: 2013-04-09
- Inventor: Dean Nobunaga , William Kammerer , Uday Chandrasekhar
- Applicant: Dean Nobunaga , William Kammerer , Uday Chandrasekhar
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
Methods for sensing, memory devices, and memory systems are disclosed. In one such memory device, a local sense circuit provides sensing of an upper group of memory cells while a global sense circuit provides sensing of a lower group of memory cells. Data sensed by the local sense circuit is transferred to the global sense circuit over local data lines or a global transfer line that is multiplexed to the local data lines. An alternate embodiment uses the local sense circuit to sense both upper and lower groups of memory cells.
Public/Granted literature
- US20130003465A1 LOCAL SENSING IN A MEMORY DEVICE Public/Granted day:2013-01-03
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