Invention Grant
- Patent Title: Method and apparatus for representing an x-ray image
- Patent Title (中): 用于表示X射线图像的方法和装置
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Application No.: US11339646Application Date: 2006-01-24
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Publication No.: US08416916B2Publication Date: 2013-04-09
- Inventor: Oliver Schütz
- Applicant: Oliver Schütz
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Schiff Hardin LLP
- Priority: DE102005003226 20050124
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
In a method and an apparatus for representing an x-ray image of an examination subject, a measurement field is determined in the image field of the x-ray image, the measurement field being dependent on the position of a subject image region representing the examination subject in the image field and being essentially situated within this subject image region grey scale values for the image rendering are determined exclusively from the intensities measured within this measurement field.
Public/Granted literature
- US20060239411A1 Method and apparatus for representing an x-ray image Public/Granted day:2006-10-26
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