Invention Grant
US08417012B2 Non-linear histogram segmentation for particle analysis 有权
用于粒子分析的非线性直方图分割

Non-linear histogram segmentation for particle analysis
Abstract:
Systems and methods for non-linear histogram segmentation for particle analysis are provided. In one embodiment, a method for analyzing particles comprises creating an initial two-dimensional histogram based on two selected parameters of the particles, filtering the initial two-dimensional histogram to generate a filtered two-dimensional image, detecting a plurality of seed populations in the filtered two-dimensional image, generating one or more linear contour lines, each having a plurality of contour points, to separate the detected seed populations, and adjusting the contour points in at least one of the linear contour lines to separate the detected seed populations.
Public/Granted literature
Information query
Patent Agency Ranking
0/0