Invention Grant
- Patent Title: Non-linear histogram segmentation for particle analysis
- Patent Title (中): 用于粒子分析的非线性直方图分割
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Application No.: US12608756Application Date: 2009-10-29
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Publication No.: US08417012B2Publication Date: 2013-04-09
- Inventor: Carlos A. Ramirez , Jaesang Park , Jiuliu Lu
- Applicant: Carlos A. Ramirez , Jaesang Park , Jiuliu Lu
- Applicant Address: US CA Brea
- Assignee: Beckman Coulter, Inc.
- Current Assignee: Beckman Coulter, Inc.
- Current Assignee Address: US CA Brea
- Agency: K&L Gates LLP
- Agent Louis C. Cullman; Andrew L. Reibman
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Systems and methods for non-linear histogram segmentation for particle analysis are provided. In one embodiment, a method for analyzing particles comprises creating an initial two-dimensional histogram based on two selected parameters of the particles, filtering the initial two-dimensional histogram to generate a filtered two-dimensional image, detecting a plurality of seed populations in the filtered two-dimensional image, generating one or more linear contour lines, each having a plurality of contour points, to separate the detected seed populations, and adjusting the contour points in at least one of the linear contour lines to separate the detected seed populations.
Public/Granted literature
- US20100111400A1 Non-Linear Histogram Segmentation for Particle Analysis Public/Granted day:2010-05-06
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