Invention Grant
US08417202B1 Circuits, architectures, apparatuses, systems, algorithms, methods and software for on-chip gain calibration
有权
用于片上增益校准的电路，架构，设备，系统，算法，方法和软件
- Patent Title: Circuits, architectures, apparatuses, systems, algorithms, methods and software for on-chip gain calibration
- Patent Title (中): 用于片上增益校准的电路，架构，设备，系统，算法，方法和软件
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Application No.: US12875890Application Date: 2010-09-03
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Publication No.: US08417202B1Publication Date: 2013-04-09
- Inventor: Neric Fong , Sang Won Son
- Applicant: Neric Fong , Sang Won Son
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: H04B17/02
- IPC: H04B17/02
Abstract:
Circuits, architectures, a system and methods for providing on-chip gain calibration. The circuit generally includes a receiver comprising (i) a resistor on a semiconductor substrate, the resistor configured to provide a signal having a noise component that varies with temperature, and (ii) an amplifier circuit on the semiconductor substrate coupled to the resistor, the amplifier circuit configured to receive the signal and provide a second signal having an amplitude greater than the first signal. The architectures and/or systems generally include those that embody one or more of the inventive concepts disclosed herein. The method generally includes (i) providing a noise signal from a resistor to an amplifier, the resistor being on a common semiconductor substrate with the amplifier, (ii) determining a resistance value of the resistor, (iii) determining an impedance at an input of the amplifier, and (iv) determining a gain of the amplifier.
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