A manufacturing exception handling system is described for use with a manufacturing execution system that controls a semiconductor manufacturing process. The present invention provides real time information to the user that identifies restrictions that have been placed on the use of entities and inventories in the semiconductor manufacturing process. The present invention also provides real time information to the user that identifies the persons who are authorized to remove the restrictions. The present invention saves the time and effort that would otherwise be required to find out why a restriction existed and who could remove the restriction during the semiconductor manufacturing process.