Invention Grant
- Patent Title: Methods and apparatus for local outlier detection
- Patent Title (中): 用于局部异常值检测的方法和装置
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Application No.: US11134843Application Date: 2005-05-20
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Publication No.: US08417477B2Publication Date: 2013-04-09
- Inventor: Emilio Miguelanez , Jacky Gorin , Eric Paul Tabor
- Applicant: Emilio Miguelanez , Jacky Gorin , Eric Paul Tabor
- Applicant Address: US AZ Tempe
- Assignee: Test Acuity Solutions, Inc.
- Current Assignee: Test Acuity Solutions, Inc.
- Current Assignee Address: US AZ Tempe
- Agency: The Noblitt Group, PLLC
- Main IPC: G06F19/00
- IPC: G06F19/00
Abstract:
A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.
Public/Granted literature
- US20060085155A1 Methods and apparatus for local outlier detection Public/Granted day:2006-04-20
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