Invention Grant
- Patent Title: Test module and test method
- Patent Title (中): 测试模块和测试方法
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Application No.: US13035835Application Date: 2011-02-25
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Publication No.: US08418011B2Publication Date: 2013-04-09
- Inventor: Masaru Goishi , Tokunori Akita
- Applicant: Masaru Goishi , Tokunori Akita
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2008-235491 20080912
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F7/58

Abstract:
There is provided a test module comprising a random number generator that generates a pseudo random pattern and includes a controller that generates a register selection signal based on a control instruction stored on an instruction memory, a plurality of polynomial configuration registers one of which is selected by the register selection signal, each polynomial configuration register having polynomial data stored therein, a plurality of initial value configuration registers one of which is selected by the register selection signal, each initial value configuration register having an initial value stored therein, and a random number generation shift register that loads the initial value from the selected one of the plurality of initial value configuration registers and sequentially generates the pseudo random pattern based on the polynomial data stored in the selected one of the plurality of polynomial configuration registers.
Public/Granted literature
- US20110276830A1 TEST MODULE AND TEST METHOD Public/Granted day:2011-11-10
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