Invention Grant
US08418011B2 Test module and test method 失效
测试模块和测试方法

Test module and test method
Abstract:
There is provided a test module comprising a random number generator that generates a pseudo random pattern and includes a controller that generates a register selection signal based on a control instruction stored on an instruction memory, a plurality of polynomial configuration registers one of which is selected by the register selection signal, each polynomial configuration register having polynomial data stored therein, a plurality of initial value configuration registers one of which is selected by the register selection signal, each initial value configuration register having an initial value stored therein, and a random number generation shift register that loads the initial value from the selected one of the plurality of initial value configuration registers and sequentially generates the pseudo random pattern based on the polynomial data stored in the selected one of the plurality of polynomial configuration registers.
Public/Granted literature
Information query
Patent Agency Ranking
0/0