Invention Grant
- Patent Title: Measure of analysis performed in property checking
- Patent Title (中): 在财产检查中进行的分析测量
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Application No.: US13027090Application Date: 2011-02-14
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Publication No.: US08418121B2Publication Date: 2013-04-09
- Inventor: Jeremy Rutledge Levitt , Christophe Gauthron , Chian-Min Richard Ho , Ping Fai Yeung , Kalyana C. Mulam , Ramesh Sathianathan
- Applicant: Jeremy Rutledge Levitt , Christophe Gauthron , Chian-Min Richard Ho , Ping Fai Yeung , Kalyana C. Mulam , Ramesh Sathianathan
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Klarquist Sparkman, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.
Public/Granted literature
- US20110138346A1 MEASURE OF ANALYSIS PERFORMED IN PROPERTY CHECKING Public/Granted day:2011-06-09
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