Invention Grant
US08418143B2 Software reliability test method using selective fault activation, test area restriction method, workload generation method and computing apparatus for testing software reliability using the same
失效
使用选择性故障激活的软件可靠性测试方法，测试区域限制方法，工作负载生成方法和使用其测试软件可靠性的计算设备
- Patent Title: Software reliability test method using selective fault activation, test area restriction method, workload generation method and computing apparatus for testing software reliability using the same
- Patent Title (中): 使用选择性故障激活的软件可靠性测试方法，测试区域限制方法，工作负载生成方法和使用其测试软件可靠性的计算设备
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Application No.: US12572939Application Date: 2009-10-02
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Publication No.: US08418143B2Publication Date: 2013-04-09
- Inventor: Gyu Il Cha , Young Ho Kim , Sung In Jung
- Applicant: Gyu Il Cha , Young Ho Kim , Sung In Jung
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Priority: KR10-2009-0040283 20090508
- Main IPC: G06F9/44
- IPC: G06F9/44 ; H04M1/24
Abstract:
Provided are a software reliability test method using selective fault activation, a test area restriction method, a workload generation method and a computing apparatus for testing software reliability using the same. The software reliability test method registers a test target module. The software reliability test method injects a fault into a fault injection target function when a caller of the fault injection target function is included in the registered module, in a case of calling the fault injection target function.
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