Invention Grant
- Patent Title: Plasma processing apparatus and method
- Patent Title (中): 等离子体处理装置及方法
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Application No.: US13003416Application Date: 2009-07-07
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Publication No.: US08419960B2Publication Date: 2013-04-16
- Inventor: Ikuo Sawada , Songyun Kang , Shigeru Kasai
- Applicant: Ikuo Sawada , Songyun Kang , Shigeru Kasai
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-182058 20080711; JP2008-254377 20080930
- International Application: PCT/JP2009/062378 WO 20090707
- International Announcement: WO2010/004997 WO 20100114
- Main IPC: C03C15/00
- IPC: C03C15/00

Abstract:
A plasma processing apparatus performs a process on a substrate by using plasma. The plasma processing apparatus includes a processing chamber; a mounting table which is located in the processing chamber and on which a substrate is mounted; a gas shower head formed of a conductive material provided to face the mounting table and having at the bottom surface thereof a plurality of gas injection openings for supplying a processing gas into the processing chamber; an induction coil to which a high frequency current is supplied to generate an inductively coupled plasma in a region surrounding a space below the gas shower head; a negative voltage supplying unit for applying a negative DC voltage to the gas shower head to allow an electrical field, which is induced by the induction coil, to be drawn to a central portion of the processing region; and a unit for evacuating the processing chamber.
Public/Granted literature
- US20110174778A1 PLASMA PROCESSING APPARATUS AND METHOD Public/Granted day:2011-07-21
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