Invention Grant
US08420305B2 Method and apparatus for generating periodic patterns by step-and-align interference lithography
有权
用于通过步进和对准干涉光刻产生周期性图案的方法和装置
- Patent Title: Method and apparatus for generating periodic patterns by step-and-align interference lithography
- Patent Title (中): 用于通过步进和对准干涉光刻产生周期性图案的方法和装置
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Application No.: US12774556Application Date: 2010-05-05
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Publication No.: US08420305B2Publication Date: 2013-04-16
- Inventor: Lon Wang , Yung-Pin Chen , Chih-Sheng Jao , Shuo-Hung Chang , Jer-Haur Chang
- Applicant: Lon Wang , Yung-Pin Chen , Chih-Sheng Jao , Shuo-Hung Chang , Jer-Haur Chang
- Applicant Address: TW Hsin-Chu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsin-Chu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW96121136A 20070612
- Main IPC: G03C5/06
- IPC: G03C5/06

Abstract:
The present invention provides a method and an apparatus for generating periodic patterns by step-and-align interference lithography, wherein at least two coherent light beams with a pattern are controlled to project onto a substrate to be exposed to form an interference-patterned region on the substrate. Thereafter, by means of moving the substrate or the light beams stepwisely, a patterned region with a large area can be formed on the substrate. According to the present invention, the optical path and exposure time may be shortened to reduce defect formation during lithographic processing and to improve the yield.
Public/Granted literature
- US20100216075A1 METHOD AND APPARATUS FOR GENERATING PERIODIC PATTERNS BY STEP-AND-ALIGN INTERFERENCE LITHOGRAPHY Public/Granted day:2010-08-26
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