Invention Grant
- Patent Title: Method of manufacturing semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US13530037Application Date: 2012-06-21
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Publication No.: US08420510B2Publication Date: 2013-04-16
- Inventor: Takashi Oda , Naohide Takamoto , Hiroyuki Senzai
- Applicant: Takashi Oda , Naohide Takamoto , Hiroyuki Senzai
- Applicant Address: JP Osaka
- Assignee: Nitto Denko Corporation
- Current Assignee: Nitto Denko Corporation
- Current Assignee Address: JP Osaka
- Agency: Alleman Hall McCoy Russell & Tuttle LLP
- Priority: JP2011-138431 20110622
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
Provided is a method of manufacturing a semiconductor device wherein the space between semiconductor elements that are three-dimensionally mounted can be filled easily and securely. The method of manufacturing a semiconductor device of the present invention includes preparing a semiconductor wafer with a plurality of members for connection formed on both first and second surfaces; preparing a laminated film including a dicing sheet with a pressure-sensitive adhesive layer laminated on a base material, and a curable film that is laminated on the pressure-sensitive adhesive layer and has a thickness equivalent to or more than the height of the member for connection on the first surface; pasting the curable film of the laminated film to the semiconductor wafer while facing the curable film to the first surface so that the members for connection are not exposed to the pressure-sensitive adhesive layer; and dicing the semiconductor wafer to form a semiconductor element.
Public/Granted literature
- US20120329250A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2012-12-27
Information query
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