Invention Grant
- Patent Title: X-ray detection system
- Patent Title (中): X射线检测系统
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Application No.: US13110214Application Date: 2011-05-18
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Publication No.: US08421007B2Publication Date: 2013-04-16
- Inventor: Masami Terauchi , Takanori Murano , Nobuo Handa , Hideyuki Takahashi
- Applicant: Masami Terauchi , Takanori Murano , Nobuo Handa , Hideyuki Takahashi
- Applicant Address: JP Miyagi JP Tokyo
- Assignee: Tohoku University,JEOL Ltd.
- Current Assignee: Tohoku University,JEOL Ltd.
- Current Assignee Address: JP Miyagi JP Tokyo
- Agency: The Webb Law Firm
- Main IPC: H01J40/00
- IPC: H01J40/00

Abstract:
An X-ray detection system has an electron beam irradiation portion, a diffraction grating, a splitter for distributing the direction of propagation of the diffracted X-rays such that an imaging plane for the diffracted X-rays is assigned to plural positions spaced apart in a direction perpendicular to the direction of energy dispersion of the diffracted X-rays, and image sensors different in energy sensitivity disposed respectively at the positions to which the imaging plane is assigned.
Public/Granted literature
- US20120292508A1 X-Ray Detection System Public/Granted day:2012-11-22
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