Invention Grant
US08421027B2 Charged particle analyser and method using electrostatic filter grids to filter charged particles
有权
带电粒子分析仪和使用静电过滤网过滤带电粒子的方法
- Patent Title: Charged particle analyser and method using electrostatic filter grids to filter charged particles
- Patent Title (中): 带电粒子分析仪和使用静电过滤网过滤带电粒子的方法
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Application No.: US12523287Application Date: 2008-01-14
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Publication No.: US08421027B2Publication Date: 2013-04-16
- Inventor: Ian Richard Barkshire , Peter John Statham , Marcus Jacka
- Applicant: Ian Richard Barkshire , Peter John Statham , Marcus Jacka
- Applicant Address: GB Oxon
- Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee Address: GB Oxon
- Agency: Blank Rome LLP
- Priority: GB0700754.5 20070115
- International Application: PCT/GB2008/000109 WO 20080114
- International Announcement: WO2008/087384 WO 20080724
- Main IPC: H01J3/26
- IPC: H01J3/26

Abstract:
A charged particle analyzer (1) comprises a first non-imaging electrostatic lens (8, 9) for receiving charged particles having divergent, trajectories and for converting the said trajectories into substantially parallel trajectories. At least one planar filter (10) is provided for receiving the charged particles having the substantially parallel trajectories and for filtering the charged particles in accordance with their respective energies. A second non-imaging electrostatic lens (11) receives the energy filtered charged particles and selectively modifies their trajectories as a function of their energies. A charged particle detector (12) then receives the charged particles in accordance with their selectively modified trajectories.
Public/Granted literature
- US20100163725A1 CHARGED PARTICLE ANALYSER AND METHOD Public/Granted day:2010-07-01
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