Invention Grant
- Patent Title: Resistance-change memory
- Patent Title (中): 电阻变化记忆
-
Application No.: US12844408Application Date: 2010-07-27
-
Publication No.: US08421051B2Publication Date: 2013-04-16
- Inventor: Mitsuru Sato , Kohichi Kubo , Chikayoshi Kamata , Noriko Bota
- Applicant: Mitsuru Sato , Kohichi Kubo , Chikayoshi Kamata , Noriko Bota
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-184791 20090807
- Main IPC: H01L47/00
- IPC: H01L47/00

Abstract:
According to one embodiment, a resistance-change memory includes a variable resistance element having a laminated structure in which a first electrode, a resistance-change film and a second electrode are laminated, and set to a low-resistance state and a high-resistance state according to stored data, an insulating film provided on a side surface of the variable resistance element, and a fixed resistance element provided on a side surface of the insulating film, and includes a conductive film, the fixed resistance element being connected in parallel with the variable resistance element.
Public/Granted literature
- US20110031463A1 RESISTANCE-CHANGE MEMORY Public/Granted day:2011-02-10
Information query
IPC分类: