Invention Grant
- Patent Title: Inspection device of plugged honeycomb structure and inspection method of plugged honeycomb structure
- Patent Title (中): 堵塞蜂窝结构检查装置及堵塞蜂窝结构检查方法
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Application No.: US12718221Application Date: 2010-03-05
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Publication No.: US08421857B2Publication Date: 2013-04-16
- Inventor: Takayoshi Akao , Akihiro Mizutani , Kensuke Tanaka
- Applicant: Takayoshi Akao , Akihiro Mizutani , Kensuke Tanaka
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2009-069363 20090323; JP2010-023749 20100205
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
There is disclosed an inspection device of a plugged honeycomb structure in which a plugged honeycomb structure is an inspection target, and the inspection device comprises a light source which illuminates one end face of the plugged honeycomb structure as the inspection target; a camera-side lens which condenses light emitted from the light source to the one end face, transmitted through plugged portions of the plugged honeycomb structure and radiated from the other end face; a camera which receives the light condensed by the camera-side lens; and an image processor which processes an image of the light received by the camera to display the contrast of the light transmitted through the plugged portions of the plugged honeycomb structure.
Public/Granted literature
- US20100238281A1 INSPECTION DEVICE OF PLUGGED HONEYCOMB STRUCTURE AND INSPECTION METHOD OF PLUGGED HONEYCOMB STRUCTURE Public/Granted day:2010-09-23
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