Invention Grant
- Patent Title: Inspection method of honeycomb structure
- Patent Title (中): 蜂窝结构检验方法
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Application No.: US12718240Application Date: 2010-03-05
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Publication No.: US08421860B2Publication Date: 2013-04-16
- Inventor: Takayoshi Akao , Akihiro Mizutani , Kensuke Tanaka
- Applicant: Takayoshi Akao , Akihiro Mizutani , Kensuke Tanaka
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2009-069370 20090323; JP2010-023751 20100205
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
An inspection method of a honeycomb structure comprising the steps of illuminating one end face of a honeycomb structure as an inspection target by a light source; condensing, by a condensing lens as a lens having an angle of view, light which is emitted from the light source to the one end face, passed through cells of the honeycomb structure and radiated from the other end face; receiving the light condensed on the condensing lens by a camera; subjecting the light received by the camera to image processing by an image processor, thereby specifying the radiated position of the light on the other end face; and calculating the tilt of the cells of the honeycomb structure from the radiated position of the light on the other end face, and the direction of the tilt.
Public/Granted literature
- US20100238284A1 INSPECTION METHOD OF HONEYCOMB STRUCTURE Public/Granted day:2010-09-23
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