Invention Grant
- Patent Title: Optical measurement apparatus including hemispherical optical integrator
- Patent Title (中): 包括半球形光学积分器的光学测量装置
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Application No.: US13029067Application Date: 2011-02-16
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Publication No.: US08422018B2Publication Date: 2013-04-16
- Inventor: Yoshihiro Osawa , Kazuaki Ohkubo
- Applicant: Yoshihiro Osawa , Kazuaki Ohkubo
- Applicant Address: JP Hirakata-Shi
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Hirakata-Shi
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: JP2010-038377 20100224
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/47

Abstract:
An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.
Public/Granted literature
- US20110205541A1 OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEGRATOR Public/Granted day:2011-08-25
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