Invention Grant
- Patent Title: Light measuring apparatus and light measuring method
- Patent Title (中): 光测量装置和光测量方法
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Application No.: US13034880Application Date: 2011-02-25
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Publication No.: US08422019B2Publication Date: 2013-04-16
- Inventor: Yumiko Yoshikawa , Tsutomu Ishi , Ryuji Funayama , Shinya Kawamata
- Applicant: Yumiko Yoshikawa , Tsutomu Ishi , Ryuji Funayama , Shinya Kawamata
- Applicant Address: JP Tokyo JP Aichi-ken
- Assignee: NEC Corporation,Toyota Jidosha Kabushiki Kaisha
- Current Assignee: NEC Corporation,Toyota Jidosha Kabushiki Kaisha
- Current Assignee Address: JP Tokyo JP Aichi-ken
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-049185 20100305
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A light with a known spectrum is emitted from a light source toward a road surface, a first reflected light that is a reflected light of the known light reflected from the road surface is received by a first light receiver, and a reflectance spectrum of the light of the road surface is calculated from a spectrum of the first reflected light received by the first light receiver and the spectrum of the known light stored in the storage unit. A second reflected light that is reflected light of an environmental light reflected from the road surface is received by a second light receiver, and a spectrum of the environmental light is calculated from a spectrum of the second reflected light received by the second light receiver and the calculated reflectance spectrum of the light of the road surface.
Public/Granted literature
- US20110216323A1 LIGHT MEASURING APPARATUS AND LIGHT MEASURING METHOD Public/Granted day:2011-09-08
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