Invention Grant
US08422030B2 Fringe projection system with intensity modulating by columns of a plurality of grating elements
有权
边缘投影系统，其具有由多个光栅元件的列的强度调制
- Patent Title: Fringe projection system with intensity modulating by columns of a plurality of grating elements
- Patent Title (中): 边缘投影系统，其具有由多个光栅元件的列的强度调制
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Application No.: US13100826Application Date: 2011-05-04
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Publication No.: US08422030B2Publication Date: 2013-04-16
- Inventor: Clark Alexander Bendall , Theodore Alexander Chilek
- Applicant: Clark Alexander Bendall , Theodore Alexander Chilek
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Hiscock & Barclay LLP
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01N21/55
Abstract:
An intensity modulating element for a probe having a plurality of light emitters for phase-shift analysis and measurement is disclosed. The intensity modulating element comprises a plurality of columns of a plurality of grating elements formed by two opposing patterns.
Public/Granted literature
- US20110205552A1 FRINGE PROJECTION SYSTEM FOR A PROBE WITH INTENSITY MODULATING ELEMENT SUITABLE FOR PHASE-SHIFT ANALYSIS Public/Granted day:2011-08-25
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