Invention Grant
- Patent Title: Method and apparatus for sending test mode signals
- Patent Title (中): 用于发送测试模式信号的方法和装置
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Application No.: US13218461Application Date: 2011-08-26
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Publication No.: US08422324B2Publication Date: 2013-04-16
- Inventor: Jason Timothy Varrichione , Prabir Kumar Majumdar , Dave Eugene Chapman
- Applicant: Jason Timothy Varrichione , Prabir Kumar Majumdar , Dave Eugene Chapman
- Applicant Address: TW Kueishan, Tao-Yuan Hsien
- Assignee: Nanya Technology Corp.
- Current Assignee: Nanya Technology Corp.
- Current Assignee Address: TW Kueishan, Tao-Yuan Hsien
- Agent Winston Hsu; Scott Margo
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A test mode signal system includes: a test mode block for generating a plurality, N, of test mode signals; a test mode send block, for generating and outputting a pulsed signal according to a command signal, and for multiplexing the N test mode signals in sets according to the pulsed signal and outputting the multiplexed pairs of test mode signals over M signal wires wherein M is less than N, such that each signal wire carries a multiplexed set of the N test mode signals; and a test mode receive block, for receiving the multiplexed sets of N test mode signals and the pulsed signal and demultiplexing each multiplexed set of N test mode signals according to the pulsed signal.
Public/Granted literature
- US20130051168A1 METHOD AND APPARATUS FOR SENDING TEST MODE SIGNALS Public/Granted day:2013-02-28
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