Invention Grant
- Patent Title: Method for detecting X-ray radiation and X-ray system
- Patent Title (中): 检测X射线和X射线系统的方法
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Application No.: US12585579Application Date: 2009-09-18
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Publication No.: US08422627B2Publication Date: 2013-04-16
- Inventor: Steffen Kappler , Christian Schröter , Karl Stierstorfer , Matthias Strassburg
- Applicant: Steffen Kappler , Christian Schröter , Karl Stierstorfer , Matthias Strassburg
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102008048306 20080922
- Main IPC: A61B6/03
- IPC: A61B6/03

Abstract:
A method is disclosed for detecting X-ray radiation from an X-ray emitter. In at least one embodiment of the method, an electric pulse with a pulse amplitude characteristic of the energy of a quantum is generated when a quantum of the X-ray radiation impinges on a sensor, wherein a number of threshold energies are predetermined. When the pulse amplitude corresponding to the respective energy is exceeded, a signal is emitted each time the pulse amplitude corresponding to a respective threshold energy is exceeded. At least one embodiment of the method permits reliable and high-quality imaging, even in image regions with high X-ray quanta rates. To this end, at least one of the threshold energies is predetermined such that it is higher than the maximum energy of the X-ray spectrum emitted by the X-ray emitter.
Public/Granted literature
- US20100074397A1 Method for detecting X-ray radiation and X-ray system Public/Granted day:2010-03-25
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