Invention Grant
US08422632B2 Method and system for crystallization and X-ray diffraction screening
有权
用于结晶和X射线衍射筛选的方法和系统
- Patent Title: Method and system for crystallization and X-ray diffraction screening
- Patent Title (中): 用于结晶和X射线衍射筛选的方法和系统
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Application No.: US13168041Application Date: 2011-06-24
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Publication No.: US08422632B2Publication Date: 2013-04-16
- Inventor: Brian Fowler , Andrew May
- Applicant: Brian Fowler , Andrew May
- Applicant Address: US CA South San Francisco
- Assignee: Fluidigm Corporation
- Current Assignee: Fluidigm Corporation
- Current Assignee Address: US CA South San Francisco
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G01N23/20
- IPC: G01N23/20
Abstract:
An integrated fluidic circuit includes a substrate layer and a first structure coupled to the substrate layer and including a plurality of channels. The first structure is configured to provide for flow of one or more materials through the plurality of channels. The integrated fluidic circuit also includes a second structure coupled to the substrate layer. The second structure includes a plurality of control channels configured to receive an actuation pressure. The integrated fluidic circuit is characterized by a thickness of less than 1.5 mm.
Public/Granted literature
- US20120021523A1 METHOD AND SYSTEM FOR CRYSTALLIZATION AND X-RAY DIFFRACTION SCREENING Public/Granted day:2012-01-26
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