Invention Grant
- Patent Title: X-ray beam device
- Patent Title (中): X射线束装置
-
Application No.: US12810381Application Date: 2009-01-02
-
Publication No.: US08422633B2Publication Date: 2013-04-16
- Inventor: Blandine Lantz , Peter Hoghoj
- Applicant: Blandine Lantz , Peter Hoghoj
- Applicant Address: FR Sassenage
- Assignee: Xenocs S.A.
- Current Assignee: Xenocs S.A.
- Current Assignee Address: FR Sassenage
- Agency: Notaro, Michalos & Zaccaria P.C.
- Priority: EP07291646 20071231
- International Application: PCT/EP2009/050001 WO 20090102
- International Announcement: WO2009/083605 WO 20090709
- Main IPC: G21K1/06
- IPC: G21K1/06

Abstract:
The invention refers to an X-ray beam device for X-ray analytical applications, comprising an X-ray source designed such as to emit a divergent beam of X-rays; and an optical assembly designed such as to focus said beam onto a focal spot, wherein said optical assembly comprises a first reflecting optical element, a monochromator device and a second reflecting optical element sequentially arranged between said source and said focal spot, wherein said first optical element is designed such as to collimate said beam in two dimensions towards said monochromator device, and wherein said second optical element is designed such as to focus the beam coming from said monochromator device in two dimensions onto said focal spot.
Public/Granted literature
- US20100272239A1 X-RAY BEAM DEVICE Public/Granted day:2010-10-28
Information query