Invention Grant
- Patent Title: Abnormality detecting apparatus for detecting abnormality at interface portion of contact arm
- Patent Title (中): 异常检测装置，用于检测接触臂的界面部分的异常
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Application No.: US12738780Application Date: 2007-10-31
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Publication No.: US08422762B2Publication Date: 2013-04-16
- Inventor: Masayoshi Ichikawa , Hiroki Ikeda
- Applicant: Masayoshi Ichikawa , Hiroki Ikeda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- International Application: PCT/JP2007/071203 WO 20071031
- International Announcement: WO2009/057203 WO 20090507
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
An abnormality detecting apparatus includes an imaging device for obtaining image data of a TIM, a failure detecting section for detecting appearance failures of the TIM on the basis of the image data of the TIM obtained by the imaging device, and a determining device for determining whether an abnormality occurs at the TIM on the basis of a detection result by the failure detecting section.
Public/Granted literature
- US20100239155A1 ABNORMALITY DETECTING APPARATUS FOR DETECTING ABNORMALITY AT INTERFACE PORTION OF CONTACT ARM Public/Granted day:2010-09-23
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