A method is provided for performing quality control on an organic light emitting diode (OLED) pixel comprising three sub-pixels formed in parallel. A method is provided for determining an weighted average current leakage for three sub-pixels of an OLED pixel. The method includes selecting a total luminance level, determining a first current flowing when a first sub-pixel is energized causing the OLED pixel to emit light having 1/3 total luminance. The method includes determining a second current flowing when the first sub-pixel and a second sub-pixel are energized causing the OLED pixel to emit light having a 213 total luminance. The method includes calculating weighted average current leakage by multiplying the first current times two forming a first product, subtracting the second current from the first product forming a result, multiplying the result by two forming a second product, and dividing the second product by nine. A computer-readable medium is provided.