Invention Grant
US08423314B2 Deterministic reconfiguration of measurement modules using double buffered DMA
有权
使用双缓冲DMA的测量模块的确定性重新配置
- Patent Title: Deterministic reconfiguration of measurement modules using double buffered DMA
- Patent Title (中): 使用双缓冲DMA的测量模块的确定性重新配置
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Application No.: US12712995Application Date: 2010-02-25
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Publication No.: US08423314B2Publication Date: 2013-04-16
- Inventor: Kunal H. Patel , David E. Klipec
- Applicant: Kunal H. Patel , David E. Klipec
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Joel L. Stevens
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28 ; G06F9/44 ; G06F9/00 ; G06F9/312

Abstract:
Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.
Public/Granted literature
- US20110119016A1 Deterministic Reconfiguration of Measurement Modules Using Double Buffered DMA Public/Granted day:2011-05-19
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