Invention Grant
- Patent Title: Failure analysis apparatus, method
- Patent Title (中): 故障分析仪器,方法
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Application No.: US12695897Application Date: 2010-01-28
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Publication No.: US08423829B2Publication Date: 2013-04-16
- Inventor: Shunsuke Yamagata , Hiroyuki Suzuki
- Applicant: Shunsuke Yamagata , Hiroyuki Suzuki
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-018374 20090129
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A debugger is operated in a host PC, and in response to operation of the debugger, first and second microprocessors execute an identical debug operation in parallel via first and second debug I/F devices. The host PC obtains internal information (dump results) from the first and second microprocessors via the first and second debug I/F devices and compares internal information (dump results) from the first and second microprocessors to perform failure analysis.
Public/Granted literature
- US20100191941A1 FAILURE ANALYSIS APPARATUS, METHOD Public/Granted day:2010-07-29
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