Invention Grant
- Patent Title: Server and method for testing inter-integrated circuit devices
- Patent Title (中): 用于测试集成电路设备的服务器和方法
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Application No.: US13308554Application Date: 2011-12-01
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Publication No.: US08423848B2Publication Date: 2013-04-16
- Inventor: Li-Fu Pan
- Applicant: Li-Fu Pan
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201010619627 20101231
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A server includes a baseboard management controller (BMC). More than one inter-integrated circuit (I2C) device may be connected to the BMC via a multiplexing switch. The server sets a first identifier for indicating which channels of I2C device are open, and a second identifier for indicating which channels of the I2C devices are closed, and sends the set information to the BMC. To test a selected I2C device, the server opens a channel to the selected I2C device and assigns the first identifier to the channel of the selected I2C device. During testing of the selected I2C device, if the BMC intends to access a different I2C device, the BMC waits for the identifier of the selected I2C device to change from the first identifier to the second identifier, and then opens a channel to the different I2C device.
Public/Granted literature
- US20120173944A1 SERVER AND METHOD FOR TESTING INTER-INTEGRATED CIRCUIT DEVICES Public/Granted day:2012-07-05
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