Invention Grant
- Patent Title: Device test data reuse for device simulation
- Patent Title (中): 设备测试数据重用用于设备仿真
-
Application No.: US12380193Application Date: 2009-02-25
-
Publication No.: US08423849B2Publication Date: 2013-04-16
- Inventor: Zhihong Qin , Brian H. Kelley , Mahesh Moorthy
- Applicant: Zhihong Qin , Brian H. Kelley , Mahesh Moorthy
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent James T. Hagler
- Main IPC: G06F9/455
- IPC: G06F9/455

Abstract:
A method and system reuse data logs generated from testing of programmable devices in order to provide an input file of parameter values and settings for use in automatically configuring a device simulator. The programmable device testing process generates a data log output with data formatted so that parameter data are associated with unique variable labels. The data log output file is processed in a parser operation that filters out private and unnecessary information, organizes the data and generates a simulation input file in a format compatible with the simulator. The process can be fully automated.
Public/Granted literature
- US20100217578A1 Device test data reuse for device simulation Public/Granted day:2010-08-26
Information query