Invention Grant
US08423849B2 Device test data reuse for device simulation 有权
设备测试数据重用用于设备仿真

Device test data reuse for device simulation
Abstract:
A method and system reuse data logs generated from testing of programmable devices in order to provide an input file of parameter values and settings for use in automatically configuring a device simulator. The programmable device testing process generates a data log output with data formatted so that parameter data are associated with unique variable labels. The data log output file is processed in a parser operation that filters out private and unnecessary information, organizes the data and generates a simulation input file in a format compatible with the simulator. The process can be fully automated.
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