Invention Grant
- Patent Title: Method for correcting high-frequency characteristic error of electronic component
- Patent Title (中): 电子元件高频特性误差校正方法
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Application No.: US12474389Application Date: 2009-05-29
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Publication No.: US08423868B2Publication Date: 2013-04-16
- Inventor: Naoki Fujii , Gaku Kamitani , Taichi Mori
- Applicant: Naoki Fujii , Gaku Kamitani , Taichi Mori
- Applicant Address: JP Nagaokakyo-Shi, Kyoto-fu
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Nagaokakyo-Shi, Kyoto-fu
- Agency: Dickstein Shapiro LLP
- Priority: JP2006-324975 20061130
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
An electronic-component high-frequency characteristic error correcting method for allowing a calibration work to be performed on a two-terminal impedance component using the same correction-target measuring system as that used in actual measurement. At least three correction data acquisition samples having different high-frequency characteristics are measured by a reference measuring system and an actual measuring system. An equation for associating the value measured by the actual measuring system with the value measured by the reference measuring system using an error correction coefficient of a transmission line is determined. A given electronic component is measured by the actual measuring system. An estimated high-frequency characteristic value of the electronic component obtained when the electronic component is measured by the reference measuring system is calculated using the determined equation.
Public/Granted literature
- US20100017669A1 METHOD FOR CORRECTING HIGH-FREQUENCY CHARACTERISTIC ERROR OF ELECTRONIC COMPONENT Public/Granted day:2010-01-21
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