Invention Grant
- Patent Title: Method and apparatus for verifying output-based clock gating
- Patent Title (中): 基于输出的时钟门控的方法和装置
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Application No.: US13035767Application Date: 2011-02-25
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Publication No.: US08423935B1Publication Date: 2013-04-16
- Inventor: Chaiyasit Manovit , Sridhar Narayanan , Wanlin Cao , Sridhar Subramanian , Alok Kuchlous
- Applicant: Chaiyasit Manovit , Sridhar Narayanan , Wanlin Cao , Sridhar Subramanian , Alok Kuchlous
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent Kin-Wah Tong; Gerald Chan
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
One embodiment of a method for verifying functional equivalency between a design of an integrated circuit and a corresponding clock-gated design utilizing output-based clock gating includes selecting a first one of a first plurality of internal state elements in the design and a corresponding first one of a second plurality of internal state elements in the clock-gated design, wherein an input to the first one of the first plurality of internal state elements serves as a first comparison point and an input to the corresponding first one of the second plurality of internal state elements serves as a second comparison point, and the design is to be compared against the clock-gated design at the first comparison point and the second comparison point and generating a test bench that identifies the first comparison point and the second comparison point as a set of comparison points.
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