Invention Grant
- Patent Title: Sample analyzer
- Patent Title (中): 样品分析仪
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Application No.: US12079794Application Date: 2008-03-28
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Publication No.: US08425839B2Publication Date: 2013-04-23
- Inventor: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-093070 20070330; JP2008-015538 20080125
- Main IPC: G01N15/06
- IPC: G01N15/06 ; G01N33/00 ; G01N33/48

Abstract:
A sample analyzer is disclosed that comprising: a first reagent container to hold a first reagent container with a first record section which contains a first reagent management information; a second reagent container holder to hold a second reagent container with a second record section which contains a second reagent management information; a first information reader; a second information reader; a registration section for registering the combination of the first reagent and the second reagent based on the first reagent management information; a measurement section for conducting a measurement of a predetermined analysis item by using the first reagent and the second reagent corresponding to the combination registered by the registration section; and a processing section for processing a measurement result obtained by the measurement section, and for obtaining an analysis result of the sample.
Public/Granted literature
- US20080240991A1 Sample Analyzer Public/Granted day:2008-10-02
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