Invention Grant
- Patent Title: Method of monitoring machine condition
- Patent Title (中): 监测机器状况的方法
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Application No.: US12859753Application Date: 2010-08-19
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Publication No.: US08426771B2Publication Date: 2013-04-23
- Inventor: Yoha Hwang , Jong Min Lee
- Applicant: Yoha Hwang , Jong Min Lee
- Applicant Address: KR Seoul
- Assignee: Korea Institute of Science and Technology
- Current Assignee: Korea Institute of Science and Technology
- Current Assignee Address: KR Seoul
- Agency: NSIP Law
- Priority: KR10-2010-0012970 20100211; KR10-2010-0077026 20100810
- Main IPC: B23K9/10
- IPC: B23K9/10

Abstract:
Various embodiments of a method for monitoring a machine condition are provided. An embodiment of the present invention provides a method of monitoring a machine condition, comprising the following steps: modeling a normal signal model performed by detecting a signal for monitoring condition of a normal machine and converting the detected signal to a normal signal model in time domain using a hidden Markov model (HMM) algorithm; calculating a probability value data of the monitoring signal at a subject machine performed by detecting a signal for monitoring condition of the subject machine in real-time and converting the detected signal to the probability value data relative to the normal state signal model using the HMM algorithm; and determining a section having deficiency where the probability value data of the monitoring signal at the subject machinery is not maintained constantly relative to the normal signal model.
Public/Granted literature
- US20110192827A1 Method Of Monitoring Machine Condition Public/Granted day:2011-08-11
Information query
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