Invention Grant
- Patent Title: Inline inspection of photovoltaics for electrical defects
- Patent Title (中): 在线检查电气缺陷的光伏
-
Application No.: US13024379Application Date: 2011-02-10
-
Publication No.: US08427185B2Publication Date: 2013-04-23
- Inventor: George H. Zapalac, Jr. , Kirk J. Bertsche , David L. Brown , J. Kirkwood H. Rough , David A. Soltz , Yehiel Gotkis
- Applicant: George H. Zapalac, Jr. , Kirk J. Bertsche , David L. Brown , J. Kirkwood H. Rough , David A. Soltz , Yehiel Gotkis
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Luedeka Neely Group, P.C.
- Agent Rick Barnes
- Main IPC: G01R31/308
- IPC: G01R31/308 ; G01R31/08
Abstract:
A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.
Public/Granted literature
- US20110133750A1 INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS Public/Granted day:2011-06-09
Information query
