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US08427211B2 Clock generation circuit and delay locked loop using the same 有权
时钟发生电路和延迟锁定环使用相同

  • Patent Title: Clock generation circuit and delay locked loop using the same
  • Patent Title (中): 时钟发生电路和延迟锁定环使用相同
  • Application No.: US12963133
    Application Date: 2010-12-08
  • Publication No.: US08427211B2
    Publication Date: 2013-04-23
  • Inventor: Hye Young Lee
  • Applicant: Hye Young Lee
  • Applicant Address: KR Gyeonggi-do
  • Assignee: SK Hynix Inc.
  • Current Assignee: SK Hynix Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: William Park & Associates Ltd.
  • Priority: KR10-2010-0051351 20100531
  • Main IPC: H03L7/06
  • IPC: H03L7/06
Clock generation circuit and delay locked loop using the same
Abstract:
A clock generation circuit includes a plurality of variable delay units configured to control a delay of an input clock signal under the control of delay control signals assigned thereto among a plurality of delay control signals, and output a plurality of delayed clock signals; a phase comparison unit configured to compare a phase of a reference clock signal which has a predetermined phase difference from the input clock signal and a phase of a delayed clock signal which is outputted from any one variable delay unit among the plurality of variable delay units; and a delay control unit configured to generate the plurality of delay control signals based on a comparison result from the phase comparison unit.
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