Invention Grant
US08427642B2 Two-dimensional optical imaging methods and systems for particle detection
有权
用于粒子检测的二维光学成像方法和系统
- Patent Title: Two-dimensional optical imaging methods and systems for particle detection
- Patent Title (中): 用于粒子检测的二维光学成像方法和系统
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Application No.: US13396393Application Date: 2012-02-14
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Publication No.: US08427642B2Publication Date: 2013-04-23
- Inventor: John Mitchell , Jon Sandberg , Dwight A. Sehler , Michael Williamson , David Rice
- Applicant: John Mitchell , Dwight A. Sehler , Michael Williamson , David Rice , Karen R. Sandberg
- Applicant Address: US CO Boulder
- Assignee: Particle Measuring Systems, Inc.
- Current Assignee: Particle Measuring Systems, Inc.
- Current Assignee Address: US CO Boulder
- Agency: Lathrop & Gage LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
Public/Granted literature
- US20120140223A1 Two-Dimensional Optical Imaging Methods and Systems for Particle Detection Public/Granted day:2012-06-07
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