Invention Grant
- Patent Title: Dual emission microscope
- Patent Title (中): 双排放显微镜
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Application No.: US13275109Application Date: 2011-10-17
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Publication No.: US08427646B2Publication Date: 2013-04-23
- Inventor: Rainer Uhl
- Applicant: Rainer Uhl
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, PC
- Agent Michael O. Scheinberg
- Main IPC: G01J3/36
- IPC: G01J3/36 ; G01J3/51 ; G02B21/36

Abstract:
A microscope device having dual emission capability, wherein detrimental effects of image-aberrations and -distortions are reduced. By providing the means for reflecting the one beam in a manner so as to invert its handedness and the means for reflecting the second beam in a manner so as to preserve its handedness, a fully symmetrical configuration is obtained, where corresponding image points in both color/polarisation channels all experience the same field-dependent aberrations.
Public/Granted literature
- US20120176488A1 DUAL EMISSION MICROSCOPE Public/Granted day:2012-07-12
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