Invention Grant
US08427795B2 Pad interface circuit and method of improving reliability of the pad interface circuit 有权
Pad接口电路和提高焊盘接口电路可靠性的方法

Pad interface circuit and method of improving reliability of the pad interface circuit
Abstract:
The pad interface circuit includes a first stack MOS transistor having a first terminal connected to a pad and a bulk connected to a first supply voltage; a second stack MOS transistor having a first terminal connected to a second terminal of the first stack MOS transistor and a second terminal, a gate terminal, and a bulk that are connected to the first supply voltage; and a voltage level sensing circuit generating a feedback voltage by using a pad voltage applied from the pad. In addition, the feedback voltage is applied to a gate terminal of the first stack MOS transistor.
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