Invention Grant
- Patent Title: Method for performing an imaging examination technique
- Patent Title (中): 执行成像检查技术的方法
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Application No.: US12457912Application Date: 2009-06-25
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Publication No.: US08428325B2Publication Date: 2013-04-23
- Inventor: Stefan Assmann
- Applicant: Stefan Assmann
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, PLC
- Priority: DE102008030890 20080630
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method is disclosed for performing an imaging examination technique. In at least one embodiment, the method includes measuring a first dataset via a first imaging examination technique, measuring a second dataset via a second imaging examination technique, segmenting the first dataset, transferring the segmentation to the second dataset, selecting at least one localization in the second dataset on the basis of the transferred segmentation, and measuring a third dataset via a third imaging examination technique such that the third dataset includes the at least one localization.
Public/Granted literature
- US20090324038A1 Method for performing an imaging examination technique Public/Granted day:2009-12-31
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