Invention Grant
- Patent Title: Inspection System
- Patent Title (中): 检验系统
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Application No.: US12732586Application Date: 2010-03-26
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Publication No.: US08428334B2Publication Date: 2013-04-23
- Inventor: Cooper S. K. Kuo , Ron Tsai
- Applicant: Cooper S. K. Kuo , Ron Tsai
- Applicant Address: TW Wen Shan
- Assignee: Cooper S.K. Kuo
- Current Assignee: Cooper S.K. Kuo
- Current Assignee Address: TW Wen Shan
- Agency: Alston & Bird LLP
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system for inspecting a product that includes a scanner to scan across the product and generate an image of the product, the image including a matrix of pixels each having a grayscale value, and an analyzing device electrically coupled with the scanner to receive and analyze the image of the product, the analyzing device including a microprocessor to calculate a reference grayscale value associated with each of the pixels in the image, wherein the reference grayscale value includes an average of the grayscale values of pixels located adjacent to the each pixel, a memory to store the reference grayscale value associated with each of the pixels and at least one threshold associated with the reference grayscale value, and a comparing module to compare the grayscale value of each of the pixels in the image with the at least one threshold associated with the each pixel.
Public/Granted literature
- US20110235868A1 Inspection System Public/Granted day:2011-09-29
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