Invention Grant
- Patent Title: Dial testing system and method
- Patent Title (中): 拨号测试系统和方法
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Application No.: US12419773Application Date: 2009-04-07
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Publication No.: US08428575B2Publication Date: 2013-04-23
- Inventor: Shengqiang Yang , Dongyong Zhu
- Applicant: Shengqiang Yang , Dongyong Zhu
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: CN200610161757 20061219
- Main IPC: H04W24/00
- IPC: H04W24/00

Abstract:
A dial testing system and a dial testing method using the dial testing system are provided. The dial testing system includes a dial testing agent device adapted to perform an automatic dial testing through a network element and control an automatic dial testing result reported by the network element; and a dial testing server adapted to collect the automatic dial testing result reported by the dial testing agent device. The dial testing system and the dial testing method provided by the present invention may assure allsidedness of a dial testing, enhance the speed and quality of the dial testing operation, and save a large amount of manpower and material resources.
Public/Granted literature
- US20090190725A1 DIAL TESTING SYSTEM AND METHOD Public/Granted day:2009-07-30
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