Invention Grant
US08428695B2 Diagnostic systems and methods utilizing probe-ions exhibiting photon avalanche effect
失效
使用显示光子雪崩效应的探针离子的诊断系统和方法
- Patent Title: Diagnostic systems and methods utilizing probe-ions exhibiting photon avalanche effect
- Patent Title (中): 使用显示光子雪崩效应的探针离子的诊断系统和方法
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Application No.: US12294961Application Date: 2007-03-19
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Publication No.: US08428695B2Publication Date: 2013-04-23
- Inventor: Jan Frederik Suijver
- Applicant: Jan Frederik Suijver
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2007/050949 WO 20070319
- International Announcement: WO2007/110804 WO 20071004
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B5/0476

Abstract:
The present disclosure provides advantageous systems and methods for significantly increasing the sensitivity and selectivity for diagnostic procedures, e.g., optical biopsy. The disclosed systems and methods use a highly non-linear effect, the so-called photon avalanche. In the regime close to the avalanche threshold, small differences in density of the probe-ion under investigation or the excitation power can result in very large changes in up-conversion emission intensity. Through this effect, it becomes possible to accurately measure the signal of an optical biopsy probe-ion only in the location(s) where its concentration is highest, while at the same time significantly reducing or eliminating measurement of background signal from probe-ions distributed with a somewhat lower concentration throughout the measurement volume. Also background auto-fluorescence of the surrounding healthy tissue is essentially absent with this technique.
Public/Granted literature
- US20100234738A1 DIAGNOSTIC SYSTEMS AND METHODS UTILIZING PROBE-IONS EXHIBITING PHOTON AVALANCHE EFFECT Public/Granted day:2010-09-16
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