Invention Grant
- Patent Title: Malfunction detecting apparatus
- Patent Title (中): 故障检测装置
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Application No.: US11976520Application Date: 2007-10-25
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Publication No.: US08428896B2Publication Date: 2013-04-23
- Inventor: Katsuyuki Iwasaki , Masashi Sekizaki
- Applicant: Katsuyuki Iwasaki , Masashi Sekizaki
- Applicant Address: JP Tokyo
- Assignee: Yazaki Corporation
- Current Assignee: Yazaki Corporation
- Current Assignee Address: JP Tokyo
- Agency: Edwards Wildman Palmer LLP
- Priority: JP2006-290752 20061026
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A malfunction detecting apparatus for detecting a malfunction of a voltage detecting device accurately, including a low-voltage-system CPU which controls voltage detecting circuits to detect voltage between both terminals of one unit cell from among unit cells included in blocks corresponding to voltage detecting circuits. When variation of the voltage between both terminals detecting by the low-voltage-system CPU is at least an allowable error determined by a detection accuracy of the voltage detecting circuits, an abnormal condition of the voltage detecting circuits is detected.
Public/Granted literature
- US20080103707A1 Malfunction detecting apparatus Public/Granted day:2008-05-01
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