Invention Grant
- Patent Title: Use of statistics to determine calibration of instruments
- Patent Title (中): 使用统计来确定仪器的校准
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Application No.: US12233985Application Date: 2008-09-19
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Publication No.: US08428909B2Publication Date: 2013-04-23
- Inventor: Daniel J. Collins
- Applicant: Daniel J. Collins
- Applicant Address: US GA Alpharetta
- Assignee: Siemens Industry, Inc.
- Current Assignee: Siemens Industry, Inc.
- Current Assignee Address: US GA Alpharetta
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
The present invention relates generally to statistics and calibration of instruments. More particularly, the invention encompasses the use of statistics to determine calibration of instruments. The present invention is also directed to a remote system for determination of re-calibration of instruments. The present invention also teaches the use of multiple statistical tests to determine need for calibration. The invention also includes a novel use of tests, such as, the F-Test, the Z-Test, to determine need for calibration. Furthermore, this invention relates to an alternate instrument scheme consisting of the use of redundant sensors and statistical analysis to avoid unnecessary calibrations and to detect sensors that are starting to drift before they go out of calibration. With this invention reduced calibration cost, increased data integrity, and reduced off-spec uncertainty is achieved.
Public/Granted literature
- US20090082987A1 USE OF STATISTICS TO DETERMINE CALIBRATION OF INSTRUMENTS Public/Granted day:2009-03-26
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